Basic Parameters
◊ Detector Technology: Amorphous Silicon
◊ Scintillator: CsI, GOS
◊ Active Area: 17 inch × 17 inch
◊ Pixel Pitch: 139 μm
◊ AD Conversion: 16 bits
◊ Pixel Matrix: 3,072 × 3,072
◊ Spatial Resolution: 3.6 lp/mm
◊ Full Image Time: 1 s
◊ Max. Energy: 350 kVp (40-150 kVp, default)
◊ Housing: Aluminum frame, carbon-fiber entrance window


Features
■ Carbon fiber front window.
■ Suitable for X-ray and gamma sources.
■ Optimized scintillator for better dose efficiency.
■ Close-to-edge imaging maximizes surface area for image capture.
■ Improved defect detection with 139 μm high-resolution pixel pitch for precision imaging and detailed analysis.
■ Ruggedized design with aluminum housing and shock absorbing panel support (shock and dust protected housing).
Applications
♦ Casting inspection.
♦ Science, art and archeology.
♦ Defense and nuclear industry.
♦ Maintenance, repair & operation in aerospace industry.
♦ Structure inspection: Electronic components, composite materials, concrete, bridges, supports, etc.
♦ Weld inspection in oil & gas, energy and aviation: Transport pipelines, complex structures (spool), boiler & pressure tubes, fuel pipes, pressure vessels and storage tanks.


